Dr Sanjoy Nandi
Publications
- Nath, S, Nandi, S, Li, S et al. 2019, 'Detection and spatial mapping of conductive filaments in metal/oxide/metal cross-point devices using a thin photoresist layer', Applied Physics Letters, vol. 114, no. 6, pp. -.
- Li, S, Liu, X, Nandi, S et al. 2019, 'Origin of Current-Controlled Negative Differential Resistance Modes and the Emergence of Composite Characteristics with High Complexity', Advanced Functional Materials, vol. 29, no. 44, pp. -.
- Wei, L, Li, S, Nandi, S et al. 2019, 'Forming-free bipolar resistive switching and quantum conductance in NiO/FTO structures', Journal of Physics D: Applied Physics, vol. 52, no. 46, pp. 1-5.
- Li, S, Liu, X, Nandi, S et al. 2018, 'Anatomy of filamentary threshold switching in amorphous niobium oxide', Nanotechnology, vol. 29, no. 37, pp. 9pp.
- Nandi, S, Venkatachalam, D, Ruffell, S et al. 2018, 'Room temperature synthesis of HfO2/HfO x heterostructures by ion-implantation', Nanotechnology, vol. 29, no. 42, pp. 9pp.
- Nandi, S, Li, S, Liu, X et al. 2017, 'Temperature dependent frequency tuning of NbOx relaxation oscillators', Applied Physics Letters, vol. 111, no. 20, pp. 1-4.
- Li, S, Liu, X, Nandi, S et al 2017, 'Coupling dynamics of Nb/Nb2O5 relaxation oscillators', Nanotechnology, vol. 28, no. 12, pp. 1-6.
- Marmitt, G,; Nandi, S.; Venkatachalam, D.; Elliman, R.; Vos, M. & Grande, P. 2017, 'Oxygen diffusion in TiO2 films studied by electron and ion Rutherford backscattering', Thin Solid Films, vol. 629, pp. 97-102.
- Liu, X, Li, S, Nandi, S et al. 2016, 'Threshold switching and electrical self-oscillation in niobium oxide films', Journal of Applied Physics, vol. 120, no. 12.
- Li, S, Liu, X, Nandi, S et al. 2015, 'High-endurance megahertz electrical self-oscillation in Ti/NbOx bilayer structures', Applied Physics Letters, vol. 106, no. 21, pp. 1-4.
- Nandi, S, Liu, X, Venkatachalam, D et al. 2015, 'Threshold current reduction for the metal-insulator transition in NbO2-x-selector devices: The effect of ReRAM integration', Journal of Physics D: Applied Physics, vol. 48, no. 19, pp. 1-8.
- Nandi, S, Liu, X, Venkatachalam, D et al. 2015, 'Self-assembly of an NbO2 interlayer and configurable resistive switching in Pt/Nb/HfO2/Pt structures', Applied Physics Letters, vol. 107, no. 13.
- Nandi, S, Liu, X, Venkatachalam, D et al. 2015, 'Effect of Electrode Roughness on Electroforming in HfO2 and Defect-Induced Moderation of Electric-Field Enhancement', Physical Review Applied, vol. 4, no. 6, pp. 1-11pp.
- Marmitt, G, Nandi, S, Rosa, L & Vos, M 2015, 'Analysis of multi-layer ERBS spectra', Journal of Electron Spectroscopy and Related Phenomena, vol. 202, pp. 26-32.
- Vos, M, Grande, P, Venkatachalam, D et al. 2014, 'Oxygen Self-Diffusion in HfO2 Studied by Electron Spectroscopy', Physical Review Letters, vol. 112, no. 17, pp. 1-5.
- Vos, M, Liu, X, Grande, P et al. 2014, 'The use of electron Rutherford backscattering to characterize novel electronic materials as illustrated by a case study of sputter-deposited NbOx films', Nuclear Instruments and Methods in Physics Research: Section B, vol. 340, pp. 58-62.
- Liu, X, Nandi, S, Venkatachalam, D et al. 2014, 'Reduced threshold current in NbO2 selector by engineering device structure', IEEE Electron Device Letters, vol. 35, no. 10, pp. 1055-1057.
- Li, S, Liu, X, Nandi, S et al. 2014, 'Temperature Dependence of Threshold Switching in NbOx Thin Films', Conference on Optoelectronic and Microelectronic Materials and Devices (COMMAD 2014), ed. Martyniuk M.Faraone, IEEE, New York, pp. 138-140.
- Nandi, S, Liu, X, Li, S et al. 2014, 'Resistive Switching Behavior in HfO2 with Nb as an Oxygen Exchange Layer', Conference on Optoelectronic and Microelectronic Materials and Devices (COMMAD 2014), ed. Martyniuk M.Faraone, IEEE, New York, pp. 290-294.
- Liu, X, Nandi, S, Venkatachalam, D et al. 2014, 'Finite Element Modeling of Resistive Switching in Nb2O5-based Memory Device', Conference on Optoelectronic and Microelectronic Materials and Devices (COMMAD 2014), ed. Martyniuk M.Faraone, IEEE, New York, pp. 280-283.
- Nandi, S, Llewellyn, D, Belay, K et al. 2014, 'Effect of Microstructure on Dielectric Breakdown in Amorphous HfO2 Films', Microscopy and Microanalysis, vol. 20, no. 3.
- Nandi, S, Nath, S, Hossain, A et al 2014, 'Effect of Zn Doping on Structural and Magnetic Properties of Ba4Ni2-xZnxFe36O60 Hexaferrites', Journal of Superconductivity and Novel Magnetism, vol. 27, no. 12, pp. 2655-2662.
- Vos, M, Grande, P, Nandi, S et al. 2013, 'A high-energy electron scattering study of the electronic structure and elemental composition of O-implanted Ta films used for the fabrication of memristor devices', Journal of Applied Physics, vol. 114, no. 7, pp. 073508/ 1-7.
- Grande, P, Vos, M, Venkatachalam, D et al. 2013, 'Determination of thickness and composition of high-k dielectrics using high-energy electrons', Applied Physics Letters, vol. 103, no. 7, pp. 071911/1-4.
- Nandi, S, Hoque, M, Ghosh, H et al 2013, 'Assessment of Wind and Solar Energy Resources in Bangladesh', Arabian Journal for Science and Engineering, vol. 38, no. 11, pp. 3113-3123.
- Nandi, S & Ranjan Ghosh, H 2009, 'A wind-PV-battery hybrid power system at Sitakunda in Bangladesh', Energy Policy, vol. 37, no. 9, pp. 3659-3664pp.