High Spatial Resolution Thermal Mapping of Volatile Switching in NbOx-Based Memristor Using In Situ Scanning Thermal Microscopy

Citation

Nandi, S, Puyoo, E, Nath, S et al. 2022, 'High Spatial Resolution Thermal Mapping of Volatile Switching in NbOx-Based Memristor Using In Situ Scanning Thermal Microscopy', ACS Applied Materials and Interfaces, vol. 14, no. 25, pp. 29025-29031.

Year

2022

ANU Authors

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