Surface characterisation of a ferroelectric single crystal by Kelvin probe force microscopy
Citation
Lau, K, Liu, Y, Li, Q et al. 2013, 'Surface characterisation of a ferroelectric single crystal by Kelvin probe force microscopy', Journal of Surface Engineered Materials and Advanced Technology, vol. 3, no. 3, pp. 190-194.Year
2013ANU Authors
Field of Research
- Solid State Chemistry