Imaging Charge Trap Distributions in GaN Using Environmental Scanning Electron Micrsocopy
Citation
Toth, M, Kucheyev, S, Williams, J et al. 2000, 'Imaging Charge Trap Distributions in GaN Using Environmental Scanning Electron Micrsocopy', Applied Physics Letters, vol. 77, pp. 1342-1344.Year
2000ANU Authors
Field of Research
- Plasma Physics; Fusion Plasmas; Electrical Discharges