An in situ electrical measurement technique via a conducting diamond tip for nanoindentation in silicon
Citation
Ruffell, S, Bradby, J, Williams, J et al. 2007, 'An in situ electrical measurement technique via a conducting diamond tip for nanoindentation in silicon', Journal of Materials Research, vol. 22, no. 3, pp. 578-586.Year
2007ANU Authors
Field of Research
- Nanotechnology Not Elsewhere Classified