Evidence of Blocking Effect on Carrier Trapping Process by Necking Region in a Very Narrow AIGaAs/GaAs V-grooved Quantum Wire Structure
Citation
Liu, Q, Sasaki, A, Ohno, N et al. 2001, 'Evidence of Blocking Effect on Carrier Trapping Process by Necking Region in a Very Narrow AIGaAs/GaAs V-grooved Quantum Wire Structure', Journal of Applied Physics, vol. 90, no. 10, pp. 5438-5440.Year
2001ANU Authors
Field of Research
- Plasma Physics; Fusion Plasmas; Electrical Discharges