Electrical Characterization of Impurity-free Disordering-induced Defects in n-GaAs using Native Oxide Layers
Citation
Deenapanray, P, Tan, H & Jagadish, C 2003, 'Electrical Characterization of Impurity-free Disordering-induced Defects in n-GaAs using Native Oxide Layers', Applied Physics A: Materials Science and Processing, vol. 76, pp. 961-964.Year
2003ANU Authors
Field of Research
- Metals And Alloy Materials