In-situ Microscopy Study of Nanocavity Shrinkage in Si under Ion Beam Irradiation
Citation
Ruault, M, Ridgway, M, Fortuna, F et al. 2003, 'In-situ Microscopy Study of Nanocavity Shrinkage in Si under Ion Beam Irradiation', European Physical Journal - Applied Physics, vol. 23, pp. 39-40.Year
2003ANU Authors
Field of Research
- Electrical And Electronic Engineering Not Elsewhere Classified