Focused ion beam milling as a universal template technique for patterned growth of carbon nanotubes
Citation
Chen, Y, Chen, H, Yu, J et al. 2007, 'Focused ion beam milling as a universal template technique for patterned growth of carbon nanotubes', Applied Physics Letters, vol. 90, no. 093126, pp. 1-3.Year
2007ANU Authors
Field of Research
- Nanotechnology Not Elsewhere Classified