Porosity as a function of stoichiometry and implantation temperature in Ge/Si1-xGex alloys (vol 119, 094303, 2016)
Citation
Alkhaldi, H, Kremer, F, Bierschenk, T et al. 2017, 'Porosity as a function of stoichiometry and implantation temperature in Ge/Si1-xGex alloys (vol 119, 094303, 2016)', Journal of Applied Physics, vol. 121, no. 4, pp. 2pp.Year
2017ANU Authors
Fields of Research
- Surfaces And Structural Properties Of Condensed Matter
- Elemental Semiconductors