Characterization of ion track morphology formed by swift heavy ion irradiation in silicon oxynitride films
Citation
Mota Santiago, P, Schauries, D, Nadzri, A et al. 2015, 'Characterization of ion track morphology formed by swift heavy ion irradiation in silicon oxynitride films', Heavy-Ion Accelerator Symposium, HIAS 2014, ed. M.Lee B.Q.Simenel C., EDP Sciences, TBC.Year
2015ANU Authors
Field of Research
- Surfaces And Structural Properties Of Condensed Matter